MeTiS SEM: Measures, Treatments and Simulations software to characterize the inclusions or particles by scanning electronic microscopy


A strong coupling between a FEG-SEM and its EDS analysis system (Brucker SDD) allows an optimal characterization of inclusions with diameters ranging from a few hundreds nanometers to a few dozens of micrometers:

  • easy and quick data input
  • complete setting of parameters in order to use a wide range of defined methods
  • observations and measurements performed using different magnification scales
  • separate analysis of the different phases in inclusions
  • complete measurement of a great number of inclusions
  • optimization of the use of microscope (day and night)
  • complete files of results (position, morphology, composition…)

MeTis – Treatment software

The treatment software, dissociated from the measurement software, allows various uses of the data contained in the files of results, and an output in EXCEL®:

  • tables of configurable statistical results
  • automatic identification of the populations of inclusions
  • graphs (histogram, ternary diagram, cartography…)
  • automatic results reports according to selected standards
  • use of the database of inclusion images

MeTiS – Simulation software

The simulation software allows to access the statistical parameters of the different methods by measurements on virtual samples:

    • transformation of « 2D » data into « 3D » data
    • assessment of the uncertainty of a measurement method
    • comparison of the index results between different methods
    • determination of optimal measurement conditions

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