Applications

MeTiS SEM: Measures, Treatments and Simulations software to characterize the inclusions or particles by scanning electronic microscopy

Measures

A strong coupling between a FEG-SEM and its EDS analysis system (Brucker SDD) allows an optimal characterization of inclusions with diameters ranging from a few hundreds nanometers to a few dozens of micrometers:

• easy and quick data input
• complete setting of parameters in order to use a wide range of defined methods
• observations and measurements performed using different magnification scales
• separate analysis of the different phases in inclusions
• complete measurement of a great number of inclusions
• optimization of the use of microscope (day and night)
• complete files of results (position, morphology, composition…)

MeTis – Treatment software

The treatment software, dissociated from the measurement software, allows various uses of the data contained in the files of results, and an output in EXCEL®:

• tables of configurable statistical results
• automatic identification of the populations of inclusions
• graphs (histogram, ternary diagram, cartography…)
• automatic results reports according to selected standards
• use of the database of inclusion images

MeTiS – Simulation software

The simulation software allows to access the statistical parameters of the different methods by measurements on virtual samples:

• transformation of « 2D » data into « 3D » data
• assessment of the uncertainty of a measurement method
• comparison of the index results between different methods
• determination of optimal measurement conditions